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Test Technology for Heterogeneous Integration

2020-07-02 - 2020-07-02
11:00 AM EDT
Webinar - Online
Denise Manning – d.manning@ieee.org
Dave Armstrong, Don Blair, Ken Lanier and Marc Hutner


The Test Technology chapter of the HIR highlights the challenges and opportunities for the semiconductor industry as we move forward.   The chapter itself is divided into 15 different white papers because of the significant diversity of different challenges the test industry must face.   Whether it’s a single cell phone SIP with incredible complexity or a use-once medical sensor where incredible accuracy is life-critical the test industry must meet the needs.  


With the significant recent increases in internet traffic, efficient testing of big-digital AI, server, and communications devices is more critical than ever before.   Marc Hutner will discuss how logic test is confronting this challenge, including a discussion on how design-for-test (DFT) is both challenging and helping the industry as we move forward. 


The roll out of 5G mobile phone devices is anticipated to be a world-changing advancement.   Meeting this need requires many advancements in the test technology of RF devices.  Don Blair will provide an overview of how the test industry is changing in order to meet these challenges.


It is really difficult for the industry to maintain a cost-effective test cost when device complexity is growing in so rapidly and in so many directions.   The number of transistors per piece of silicon continues to grow.   The number of die per package now accelerates this transistor growth exponentially.  Additionally, test must evolve in very many different domains, some quite new and difficult;  (Logic, RF, Photonic, Memory, Thermal, Sensors, Analog, Reliability, 3D, System Level, Automotive, Quantum, Medical, etc.)    All this does make it difficult to keep the cost-of-test from skyrocketing.   Ken Lanier will discuss steps the industry is taking to meet these challenges and what the results and forecast is for device test costs.



Dave Armstrong in his capacity as Director of Business Development, works directly with customers and Advantest’s global R&D teams to define, develop and deliver creative solutions to the most demanding test challenges. Additionally, Dave is currently the Chairman of the Test Technology Working group for the Heterogeneous Integration Roadmap. Prior to joining Advantest in 2004, Dave spent over two decades in HP/Agilent’s IC test group achieving the role of Principal Engineer. Prior to joining HP Dave worked in the semiconductor industry in areas of IC and system design, product/yield engineering, as well as test engineering. Dave Armstrong received degrees in Electrical, Computer, and Environmental Engineering from the University of Michigan in 1974.


Ken Lanier has been in the ATE industry for over 30 years.  He has held positions in applications engineering, system instrument design, as well as engineering and marketing management.  He is currently a Principal Technologist at Teradyne in North Reading, Massachusetts.  He was formerly a Director of Marketing at LTX.  He received his Bachelor’s degree in Electrical Engineering at Worcester Polytechnic Institute.


Don Blair is a Business Development Manager working for Advantest for 33 years (HP > Agilent > Verigy > Advantest) and 5 years for Schlumberger before that. His experience base has been digital and mixed-signal testing starting with Series 10/20 and 80 and continuing on with the V93000 platform. He currently is the lead on the HIR TWG for the Analog Mixed Signal and RF teams.


Marc Hunter  is the DfX Systems Engineering responsible for design to test solutions that accelerate ATE debug. He has worked at Teradyne for 20 years in a variety of engineering and technical management positions. This includes analog IP design, ASIC development management, Instrument design, ATE system definition and technical product management. He also is a contributor to the Heterogeneous Integration Roadmap for Semiconductors (formerly the ITRS roadmap) for test.


Download HIR Chapter 17 Test Technology 

Event Recording
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