Webinar on HAXPES

Date:  March 2, 2022

Time: 12:00 pm EST

Speaker: Dr. Matt Wahila, PhD

Abstract: Hard X-ray Photoelectron Spectroscopy (HAXPES) is an extremely powerful analytical tool for characterizing and understanding materials. Synchrotron HAXPES typically uses a tunable, focused X-ray beam in the tender spectrum (2.0 keV to 7.5 keV) to probe the depth-dependent chemical, electronic, and molecular structure near the surface of material with a wide range of probing depths (approx. 3 to 30 nm below the surface). The spot size at the sample can be focused to as small as ~50 μm. Unfortunately, HAXPES remains a relatively unknown and often underutilized technique due to its requirement of a large synchrotron facility.

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