ECTC 2021 Best Papers Available as Open Access Until 24 September, 2022

The opportunity to access Best Papers from ECTC 2021 as Open Access ends September 24th, 2022.

1)      Best Session Paper
  Proof of Concept: Glass-Membrane Based Differential Pressure Sensor
Anatoly Glukhovskoy - Leibniz University, Maren S. Prediger - Leibniz University, Jennifer Schäfer- Leibniz University, Norbert Ambrosius - LPKF Laser & Electronics AG, Aaron Vogt - LPKF Laser & Electronics AG, Rafael Santos - LPKF Laser & Electronics AG, Roman Ostholt - LPKF Laser & Electronics AG, and Marc Christopher Wurz - Leibniz University

2)      Best Interactive Presentation Paper 
  System in package embedding III-V chips by fan-out wafer-level packaging for RF applications
Arnaud Garnier, Laetitia Castagné, Florent Gréco, Thomas Guillemet, Laurent Maréchal, Mehdy Neffati, Rémi Franiatte, Perceval Coudrain, Stéphane Piotrowicz, and Gilles Simon - CEA-Leti. Authors 1-3, 7, 8, 10: CEA-Leti, Author 4: Thales DMS, Authros 5, 6: United Monolithic
Arnaud Garnier - CEA-Leti, Laetitia Castagné - CEA-Leti, Florent Gréco - CEA-Leti, Thomas Guillemet - Thales DMS, Laurent Maréchal - United Monolithic Semiconductors, Mehdy Neffati - United Monolithic Semiconductors, Rémi Franiatte - CEA-Leti, Perceval Coudrain - CEA-Leti, Stéphane Piotrowicz - III-V Lab, Gilles Simon - CEA-Leti

3)      Outstanding Session Paper
 Ultra-Thinning of 20 nm-Node DRAMs down to 3 um for Wafer-on-Wafer (WOW) Applications
Zhiwen Chen - Tokyo Institute of Technology, Naoko Araki - Tokyo Institute of Technology, Youngsuk Kim - Tokyo Institute of Technology, Tadashi Fukuda - Tokyo Institute of Technology, Koji Sakui - Tokyo Institute of Technology, Tomoji Nakamura - Tokyo Institute of Technology, Tatsuji Kobayashi - Micron Memory Japan, Takashi Obara - Micron Memory Japan, and Takayuki Ohba - Tokyo Institute of Technology 

4)      Outstanding Interactive Presentation Paper 
  Cu Recrystallization and the Formation of Epitaxial and Non-Epitaxial Cu/Cu/Cu Interfaces in Stacked Blind Micro Via Structures
T. Bernhard, S. Dieter, R. Massey, S. Kempa, E. Steinhäuser, F. Brüning. All authors: Atotech Deutschland GmbH.

5)      Intel Best Student Session Paper
  Mechanical Behavior and Reliability of SAC+Bi Lead Free Solders with Various Levels of Bismuth
KM Rafidh Hassan, Jing Wu, Mohammad S. Alam, Jeffrey Suhling, and Pradeep Lall. All authors: Auburn University